Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
EDN

Fault Coverage Vies For Clear DFT Rules

This is the second part of a two-part discussion (Part 1 appeared in August) in which the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs. These elements ...
EDN

Moving DFT to RTL overcomes test vector issues

In the IC design flow, design-for-test is often an afterthought. First, the design is coded, then simulated, then synthesized, and only after all that – usually months into the design cycle – it's ...
Semiconductor Engineering

A Simple Way To Improve Automotive In-System Test

Test points for hybrid ATPG/LBIST applications make it easier to reach the ISO 26262 standard of 90% stuck-at coverage for in-system test. The remarkable growth in automotive IC design has prompted a ...