Semiconductor Engineering

Integration Challenges For ATE Data

Tighter integration of automatic test equipment (ATE) into semiconductor manufacturing, so that data from one process can be seamlessly leveraged by another, holds significant promise to boost ...
Seeking Alpha

Western Digital Opens Expanded System Integration Test Lab to Accelerate Customer Success in the Growing AI and Cloud Era

New Rochester, Minn. Facility Accelerates Qualification of Next-Generation High-Capacity HDDs, Enabling Customers to Quickly Deploy Maximum Storage Density with Unmatched Economics at Scale ROCHESTER, ...
Becker's Hospital Review

Integration challenges dominate healthcare IT leaders’ concerns: Report

Integration of disparate IT systems is one of the most significant challenges for healthcare CIOs and IT leaders, according to a report from healthcare operations software provider Symplr. Symplr ...
EDN

System-level test’s expanding role in producing complex chips

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
Semiconductor Engineering

Chiplet Integration and Testing: Key Lessons for Next-Gen Semiconductor Packaging

The floodgates for chiplet-based design have officially opened. Over the past several quarters, manufacturing test flows have been validating 2.5D package architectures, and production volumes are ...