Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

As designs move to smaller nanometer processes, test development is becoming more difficult, effectively impeding product release. Not only are test sets growing at a very high rate, but they are ...

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...

PARIS — Synopsys Inc. announced that STMicroelectronics NV has selected Synopsys' TetraMAX small delay defect (SDD) automatic test pattern generation (ATPG) and failure diagnostics solution in order ...

Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...